Monday, 26 January 2015

New speaker announced - Centrax Industries Ltd

We are pleased to confirm that Richard Bartlett, Materials Engineer at Centrax Industries Ltd, will be joining our panel of speakers on Thursday 12 February, for our joint event with WEAF at the Plymouth Electron Microscopy Centre.

The day's programme is shaping up as follows:

11.30 - Arrival and networking
12.00 - Welcome - Simon Young, Chief Executive, WEAF
12.10 - PEMC - practical examples of how we support business -and FREE support until 31 March 2015 - Claire Pearce, Project Manager, PEMC
12.20 - Using the technique of EBSD to make a difference to  your company - Kim Larsen, Oxford Instruments
12.40 - Precision micro-electronics for the aerospace and defence sctors - how we use electron microscopy for quality control - Victor Arghyrou, UTC Aerospace Systems
13.00 - What else we can do for you (funding, KTP) - Catherine Parnall, Plymouth University
13.10 - Lunch
14.10 - Turbine engineering for aerospace - how we use electron microscopy to analyse our materials - Richard Bartlett, Centrax Industries Ltd
14.30 - Aircraft material and accident investigations - Professor Neil James, Plymouth University
15.00 - Tour of the University technical facilities (PEMC, Materials Characterisation Lab) - Dr Roy Moate, Plymouth University
16.00 - Event close

To book your please, place to go the WEAF website.

Tuesday, 13 January 2015

Bringing big company technology to SMEs - Thursday 12 February (11.30 - 16.00)



Plating thickness and integrity - 34um

This joint event, being held at Plymouth University with WEAF (the West of England Aerospace Forum) is your opportunity to come and see first-hand the cutting edge PEMC facilities and discuss how you can use this outstanding capability for FREE until the end of March 2015 to help increase your company's competitiveness. There will also be the opportunity to meet and hear from large multi-national companies in the aerospace industry.

During the event, we will explore the relevance and use of electron microscopy in precision engineering, aerospace, defence and manufacturing businesses. Not only will you get the opportunity to have a look around the PEMC and meet companies from across the region involved in the aerospace supply chain, but you will also hear from our experienced speakers who include:

  • Simon Young - Chief Executive of WEAF
  • Victor Arghyrou - UTC Aerospace Systems (why we use the PEMC)
  • Professor Neil James - Plymouth University (aircraft materials and accident investigations)
  • Kim Larsen - Oxford Instruments (using EBSD to make a difference to your company)

In addition, if you are a small or medium sized company based in the South West, you may be able to get 12 hours of FREE support from the PEMC between now and the end of March 2015, thanks to European funding; so please bring along a sample/component on the day for us to analyse for you - we can help with:

  • improved quality control - objectively confirm precision measurements (e.g. plating thickness above) and precision finishes
  • product improvement - examine the performance of a new material in your existing product / optimise material use
  • process improvement - examine the effect of a new process on your components at high magnification
  • reverse engineering - what exactly is that metal component made of?
  • supply issues - how do these four stainless steel samples differ in their composition - which is best for our purposes?
  • identification of contaminants - what is that black spec on our component?
  • reduction of waste - by identifying and eliminating component and process failure
  • capturing high quality images for your use in promotional materials.
Please note that there will be a small charge to attend the event (£25 WEAF members, £35 non-WEAF members).

BOOK YOUR PLACE NOW!
     If you can't join us on the 12th, but would still like to discuss how you could use your 12 hours of free time with the electron microscopes, please feel free to contact me direct on:
    • T: 01752 588908 or 07738 858494
    • E: claire.pearce@plymouth.ac.uk
    A metal fracture - using the EBSD technique

    Wednesday, 26 November 2014

    Aerospace Event Postponed



    Advanced Materials Characterisation – WEAF and the Plymouth Electron Microscopy Centre (PEMC)

    Unfortunately, we have postponed next Wednesday’s joint event with WEAF at Plymouth University until the New Year - watch this space for details!

    However, if you haven't already done so, please contact Claire Pearce to find out how electron microscopy could work for your company. The PEMC has funding up until March 2015 to give small companies in the south west 12 hours of free support – so please use your 12 hours to try us out!




          

    Thursday, 20 November 2014

    Advanced Materials Characterisation – WEAF and the Plymouth Electron Microscopy Centre (PEMC)



    As someone who is interested in the Plymouth Electron Microscopy Centre (PEMC), we’d love you to join us on Wednesday 3 December for an event we’re hosting with the West of England Aerospace Forum (WEAF), which will explore the relevance and use of electron microscopy in precision engineering, aerospace, defence and manufacturing businesses.

    Not only will you get the opportunity to have a look around the PEMC and meet companies from across the region involved in the aerospace supply chain, but you will also hear from our experienced speakers who include:

    • Simon Young – WEAF
    • Kim Larsen – Oxford  Instruments (characterising materials, using EM)
    • Professor Neil James –Plymouth University (aircraft materials and accident investigations)
    • Victor Arghyrou – UTC Aerospace (why we use the PEMC)

    In addition, as you are a small-medium sized company based in the south–west, you are able to get 12 hours of free support from the PEMC between now and March 2015, thanks to European funding.

    So please bring along a component or sample on the day for us to analyse – we can carry out:

    • Analysis of the properties of materials – e.g. are these two stainless steel samples identical?
    • Analysis of defects and component failure – e.g. why are two surfaces not bonding?
    • Quality control – objective information for your customers – e.g. confirmation of plating thickness
    • Bio-imaging
    • Mineralogical analysis
    • Imaging

    To see the full programme for Wednesday 3 December, and to book, go to:

    If you can’t join us on the 3rd, but would still like to discuss how you could use your 12 hours of free time with the electron microscopes, please feel free to contact me: